DuOSens
Hyperspectral IR-sensors
THE CHALLENGE
IR photodetectors are used for spectroscopic applications (material testing and identification, monitoring plant growth/environmental parameters for smart agriculture, geological investigations). Many applications need to combine VIS (<900 nm) and SWIR (>900 nm) measurements. Today such hyperspectral sensors are made of two incompatible materials systems (VIS: Si-based, SWIR: InGaAs) which makes them very expensive. Additionally the used material is toxic.
The monolithic IR photodetector we have developed consists of modified Si, detects reflected radiation in the range of 300-1900+nm and can therefore used for hyperspectral measurements. The sensor is manufactured using conventional scalable CMOS processes. This allows for a cost reduction of up to a factor of 100 compared to the state of the art.
OUR SOLUTION
PROJECT LANDSCAPE
Industry: industrial process monitoring, smart agriculture, geology
Area of Application: spectroscopy (material testing, process monitoring)
Transfer Path: start-up
Target Group: sensor manufacturers
LET'S CONNECT AND CO-CREATE
Name: Dr. Viktor Begeza, Dr. Yonder Berencen
Institution: Helmholtz-Zentrum Dresden-Rossendorf e.V.
Department: Semiconductor Materials
