DuOSens

Hyperspectral IR-sensors

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LET'S CONNECT AND CO-CREATE

Name:

Institution:

Department:

Dr. Viktor Begeza

Helmholtz-Zentrum Dresden-Rossendorf e.V.

Semiconductor Materials

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PROJECT LANDSCAPE

Industry:

Area of Application:

Transfer Path:

Target Group:

industrial process monitoring, smart agriculture, geology

spectroscopy (material testing, process monitoring)

start-up

sensor manufacturers

OUR SOLUTION

The monolithic IR photodetector we have developed consists of modified Si, detects reflected radiation in the range of 300-1900+nm and can therefore used for hyperspectral measurements. The sensor is manufactured using conventional scalable CMOS processes. This allows for a cost reduction of up to a factor of 100 compared to the state of the art.

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THE CHALLENGE

IR photodetectors are used for spectroscopic applications (material testing and identification, monitoring plant growth/environmental parameters for smart agriculture, geological investigations). Many applications need to combine VIS (<900 nm) and SWIR (>900 nm) measurements. Today such hyperspectral sensors are made of two incompatible materials systems (VIS: Si-based, SWIR: InGaAs) which makes them very expensive. Additionally the used material is toxic.